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Onodera, Hidetoshi. (2008). [IEEE 2008 IEEE International Electron Devices Meeting (IEDM) - San Francisco, CA, USA (2008.12.15-2008.12.17)] 2008 IEEE International Electron Devices Meeting - Variability modeling and impact on design. , (), 1–4. doi:10.1109/iedm.2008.4796791 
An interview with Sci-Hub Founder Alexandra Elbakyan,Who exactly should pay for academic research