Ang-Chih Hsieh, ; TingTing Hwang, ; Ming-Tung Chang, ; Min-Hsiu Tsai, ; Chih-Mou Tseng, ; Li, Hung-Chun . (2010). [IEEE 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - Dresden (2010.03.8-2010.03.12)] 2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010) - TSV redundancy: Architecture and design issues in 3D IC. , (), 166–171.
doi:10.1109/DATE.2010.5457218
